Jung-Yu Hsieh: шукати на сайті Z-Library

Пожертвування 15 вересня 2024 – 1 жовтня 2024 Про збір коштів

Найбільша колекція наукових статей у сіті. 70,000,000+ безкоштовних статей.

Пожертвування 15 вересня 2024 – 1 жовтня 2024

Z-Library - одна з найбільших онлайн-бібліотек у світі, в якій зберігається більше 17,000,000 книг та 84,837,000 статей. Ми намагаємось зробити літературу доступною кожному. Сьогодні (15 вересня 2024) ми відкриваємо додатковий збір пожертвувань на підтримку та розвиток проекту.

Також БЕЗЛІМТНІ завантаження (протягом 31 дня після завершення пожертвування) доступні для ВСІХ користувачів, які підтримають проект в період збору коштів до 1 жовтня 2024.

Про збір коштів Детальніше

Підтримати

Книги
Статті (35)
Найпопулярніші
Перелік
- Перелік
- Таблиця

1

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Understanding STI edge fringing field effect on the scaling of charge-trapping (CT) NAND Flash and modeling of incremental step pulse programming (ISPP)

Lue, Hang-Ting, Tzu-Hsuan Hsu,, Yi-Hsuan Hsiao,, Sheng-Chih Lai,, Erh-Kun Lai,, Shih-Ping Hong,, Ming-Tsung Wu,, Hsu, F. H., Lien, N. Z., Chi-Pin Lu,, Szu-Yu Wang,, Jung-Yu Hsieh,, Ling-Wu Ya

Рік:

2009

Мова:

english

Файл:

PDF, 1.35 MB

english, 2009

2

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - A study of surface condensation defect improvement after cryogenic implantation

Yu-Min Lin,, Jung-Yi Guo,, Jeng-Hwa Liao,, Hsin-Ju Lin,, Jung-Yu Hsieh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2014

Мова:

english

Файл:

PDF, 986 KB

english, 2014

3

Improvement of cell reliability by floating gate implantation on 1Xnm NAND flash memory

Liao, Jeng-Hwa, Ko, Zong-Jie, Lin, Yu-Min, Lin, Hsing-Ju, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

Solid-State Electronics

Рік:

2018

Мова:

english

Файл:

PDF, 2.28 MB

english, 2018

4

Dual gate oxide integrity improvement by implementing nitrogen implantation technology

Tuung Luoh, Jung-Yu Hsieh, Ling-Wuu Yang, Chi-Tung Huang, Kuang-Chao Chen, Henry Chung, Joseph Ku, Chih-Yuan Lu

Журнал:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Рік:

2005

Мова:

english

Файл:

PDF, 248 KB

english, 2005

5

[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - A Study of Sub-40nm FinFET BE-SONOS NAND Flash

Hsu, Tzu-Hsuan, Lue, Hang-Ting, Peng, Wu-Chin, Tsai, Cheng-Hung, King, Ya-Chin, Wang, Szu-Yu, Wu, Ming-Tsung, Hong, Shih-Ping, Hsieh, Jung-Yu, Yang, Ling-Wu, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-C

Рік:

2008

Мова:

english

Файл:

PDF, 796 KB

english, 2008

6

Study of charge trapping characteristics of SONOS with various trapping layers using gate-sensing and channel-sensing (GSCS) method

Liao, Jeng-Hwa, Lin, Hsing-Ju, Lue, Hang-Ting, Du, Pei-Ying, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

Solid-State Electronics

Рік:

2013

Мова:

english

Файл:

PDF, 1.55 MB

english, 2013

7

[IEEE 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - San Francisco, CA, USA (2010.07.11-2010.07.13)] 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Robust shallow trench isolation technique used for 75nm nor flash memory

Liao, Jeng-Hwa, Wei, Kuo-Liang, Lee, Hong-Ji, Cheng, Chun-Min, Chiang, Chun-Ling, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2010

Мова:

english

Файл:

PDF, 1.60 MB

english, 2010

8

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - A highly scalable 8-layer 3D vertical-gate (VG) TFT NAND Flash using junction-free buried channel BE-SONOS device

Lue, Hang-Ting, Hsu, Tzu-Hsuan, Hsiao, Yi-Hsuan, Hong, S. P., Wu, M. T., Hsu, F. H., Lien, N. Z., Wang, Szu-Yu, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Lu, Chi

Рік:

2010

Мова:

english

Файл:

PDF, 1.92 MB

english, 2010

9

Discharge and photo-luminance properties of a parallel plates electron emission lighting device

Li, Chia-Hung, Liu, Ming-Chung, Chiang, Chang-Lin, Li, Jung-Yu, Chen, Shih-Pu, Hsieh, Tai-Chiung, Chou, Yen-I, Lin, Yi-Ping, Wang, Po-Hung, Chun, Ming-Shin

Журнал:

Рік:

2011

Мова:

english

Файл:

PDF, 1.96 MB

english, 2011

10

Clinical Characteristics of Patients with Sporadic Colorectal Cancer and Primary Cancers of Other Organs

Jung-Yu Kan, Jan-Sing Hsieh, Yong-Sang Pan, Wen-Ming Wang, Fang-Ming Chen, Chang-Ming Jan, Yu-Sheng Huang, Tsung-Jen Huang, Jaw-Yuan Wang

Журнал:

The Kaohsiung Journal of Medical Sciences

Рік:

2006

Мова:

english

Файл:

PDF, 317 KB

english, 2006

11

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - A Multi-Layer Stackable Thin-Film Transistor (TFT) NAND-Type Flash Memory

Lai, Erh-Kun, Lue, Hang-Ting, Hsiao, Yi-Hsuan, Hsieh, Jung-Yu, Lu, Chi-Pin, Wang, Szu-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Gong, Jeng, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2006

Мова:

english

Файл:

PDF, 2.00 MB

english, 2006

12

[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Highly Reliable MA BE-SONOS (Metal-Al2O3 Bandgap Engineered SONOS) Using a SiO2 Buffer Layer

Lai, Sheng-Chih, Lue, Hang-Ting, Liao, Chien-Wei, Wu, Tai-Bor, Yang, Ming-Jui, Lue, Yi-Hsien, Hsieh, Jung-Yu, Wang, Szu-Yu, Luo, Guang-Li, Chien, Chao-Hsin, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2008

Мова:

english

Файл:

PDF, 538 KB

english, 2008

13

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A High-Speed BE-SONOS NAND Flash Utilizing the Field-Enhancement Effect of FinFET

Hsu, Tzu-Hsuan, Lue, Hang-Ting, Lai, Erh-Kun, Hsieh, Jung-Yu, Wang, Szu-Yu, Yang, Ling-Wu, King, Ya-Chin, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 1.84 MB

english, 2007

14

[IEEE 2007 6th International Special Topic Conference on Information Technology Applications in Biomedicine - Tokyo, Japan (2007.11.8-2007.11.11)] 2007 6th International Special Topic Conference on Information Technology Applications in Biomedicine - Leg Crossing Postures Analysis Based on Pulse Transit Time

Chang, Kang-Ming, Chang, Keng-Ming, Hsieh, Ai-Yun, Li, Jung-Yu

Рік:

2007

Мова:

english

Файл:

PDF, 1.81 MB

english, 2007

15

[IEEE 2009 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2009.04.27-2009.04.29)] 2009 International Symposium on VLSI Technology, Systems, and Applications - Reliability study of MANOS with and without a SiO2 buffer layer and BE-MANOS charge-trapping NAND flash devices

Liao, Chien-Wei, Lai, Sheng-Chih, Lue, Hang-Ting, Yang, Ming-Jui, Shen, Chin-Yen, Lue, Yi-Hsien, Huang, Yu-Fong, Hsieh, Jung-Yu, Wang, Szu-Yu, Luo, Guang-Li, Chien, Chao-Hsin, Hsieh, Kuang-Yeu, Liu, R

Рік:

2009

Мова:

english

Файл:

PDF, 401 KB

english, 2009

16

[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - An Oxide-Buffered BE-MANOS Charge-Trapping Device and the Role of Al2O3

Lai, Sheng-Chih, Lue, Hang-Ting, Liao, Chien-Wei, Huang, Yu-Fong, Yang, Ming-Jui, Lue, Yi-Hsien, Wu, Tai-Bor, Hsieh, Jung-Yu, Wang, Szu-Yu, Hong, Shih-Ping, Hsu, Fang-Hao, Shen, Chih-Yen, Luo, Guang-L

Рік:

2008

Мова:

english

Файл:

PDF, 635 KB

english, 2008

17

[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - A Study on the Erase and Retention Mechanisms for MONOS, MANOS, and BE-SONOS Non-Volatile Memory Devices

Lai, Sheng-Chih, Lue, Hang-Ting, Hsieh, Jung-Yu, Yang, Ming-Jui, Chiou, Yan-Kai, Wu, Chia-Wei, Wu, Tai-Bor, Luo, Guang-Li, Chien, Chao-Hsin, Lai, Erh-Kun, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 1.02 MB

english, 2007

18

-Type Flash Memory

Hsu, Tzu-Hsuan, Lue, Hang Ting, King, Ya-Chin, Hsieh, Jung-Yu, Lai, Erh-Kun, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Журнал:

IEEE Electron Device Letters

Рік:

2007

Мова:

english

Файл:

PDF, 307 KB

english, 2007

19

[IEEE 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (2007.08.26-2007.08.30)] 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - MA BE-SONOS: A Bandgap Engineered SONOS using Metal Gate and Al2O3 Blocking Layer to Overcome Erase Saturation

Lai, Sheng-Chih, Lue, Hang-Ting, Yang, Ming-Jui, Hsieh, Jung-Yu, Wang, Szu-Yu, Wu, Tai-Bor, Luo, Guang-Li, Chien, Chao-Hsin, Lai, Erh-Kun, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 228 KB

english, 2007

20

[IEEE 2008 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2008.04.21-2008.04.23)] 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - A High Performance and Scalable FinFET BE-SONOS Device for NAND Flash Memory Application

Hsu, Tzu-Hsuan, Lue, Hang-Ting, Peng, Wu-Chin, King, Ya-Chin, Wu, Chia-Wei, Wang, Szu-Yu, Wu, Ming-Tsung, Hong, Shih-Ping, Hsieh, Jung-Yu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich,

Рік:

2008

Мова:

english

Файл:

PDF, 502 KB

english, 2008

21

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface

Wang, Szu-Yu, Lue, Hang-Ting, Hsu, Tzu-Hsuan, Du, Pei-Ying, Lai, Sheng-Chih, Hsiao, Yi-Hsuan, Hong, Shih-Ping, Wu, Ming-Tsung, Hsu, Fang-Hao, Lian, Nan-Tzu, Lu, Chi-Pin, Hsieh, Jung-Yu, Yang, Ling-Wu,

Рік:

2010

Мова:

english

Файл:

PDF, 439 KB

english, 2010

22

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - A novel planar floating-gate (FG) / charge-trapping (CT) NAND device using BE-SONOS inter-poly dielectric (IPD)

Lue, Hang-Ting, Pei-Ying Du,, Tzu-Hsuan Hsu,, Yi-Hsuan Hsiao,, Sheng-Chih Lai,, Szu-Yu Wang,, Shih-Ping Hong,, Ming-Tsung Wu,, Hsu, F. H., Lien, N. Z., Chi-Pin Lu,, Jung-Yu Hsieh,, Ling-Wu Ya

Рік:

2009

Мова:

english

Файл:

PDF, 1.21 MB

english, 2009

23

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Performance and reliability optimizations of BE-SONOS NAND Flash using SiON bandgap-tuning tunneling barrier

Liao, Jeng-Hwa, Hsieh, Jung-Yu, Lue, Hang-Ting, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih Yuan

Рік:

2010

Мова:

english

Файл:

PDF, 972 KB

english, 2010

24

A lighting mechanism for flat electron emission lamp

Li, Jung-Yu, Chen, Shih-Pu, Li, Chia-Hung, Lin, Yi-Ping, Chou, Yen-I, Liu, Ming-Chung, Wang, Po-Hung, Zeng, Hui-Kai, Hsieh, Tai-Chiung, Juang, Jenh-Yih

Журнал:

Applied Physics Letters

Рік:

2009

Мова:

english

Файл:

PDF, 561 KB

english, 2009

25

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Study of sub-30nm thin film transistor (TFT) charge-trapping (CT) devices for 3D NAND flash application

Tzu-Hsuan Hsu,, Lue, Hang-Ting, Chih-Chang Hsieh,, Lai, Erh-Kun, Lu, Chi-Pin, Hong, Shih-Ping, Wu, Ming-Tsung, Hsu, F. H., Lien, N. Z., Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao,

Рік:

2009

Мова:

english

Файл:

PDF, 904 KB

english, 2009

26

[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - A study of barrier engineered Al2O3 and HfO2 high-K charge trapping devices (BE-MAONOS and BE-MHONOS) with optimal high-K thickness

Lai, Sheng-Chih, Chen, Chih-Ping, Du, Pei-Ying, Lue, Hang-Ting, Heh, Dawei, Shen, Chih-Yen, Hsueh, F.K., Wu, H.Y., Liao, Jeng-Hwa, Hsieh, Jung-Yu, Wu, M.T., Hsu, F.H., Hong, S.P., Yeh, C.T., Hung, Yun

Рік:

2010

Мова:

english

Файл:

PDF, 1001 KB

english, 2010

27

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Study of the charge-trapping characteristics of silicon-rich nitride thin films using the gate-sensing and channel-sensing (GSCS) method

Lu, Chi-Pin, Hsieh, Jung-Yu, Du, Pei-Ying, Lue, Hang-Ting, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2009

Мова:

english

Файл:

PDF, 448 KB

english, 2009

28

Physical and electrical characteristics of silicon oxynitride films with various refractive indices

Liao, Jeng-Hwa, Hsieh, Jung-Yu, Lin, Hsing-Ju, Tang, Wei-Yao, Chiang, Chun-Ling, Lo, Yun-Shan, Wu, Tai-Bor, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

Journal of Physics D Applied Physics

Рік:

2009

Мова:

english

Файл:

PDF, 1004 KB

english, 2009

29

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Investigation of floating gate depletion effect on NAND FLASH reliability

Jeng-Hwa Liao,, Jung-Yi Guo,, Yu-Min Lin,, Jung-Yu Hsieh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2014

Мова:

english

Файл:

PDF, 3.37 MB

english, 2014

30

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Study on the improved thermal stability of cobalt silicide film by using cryogenic carbon PAI

Jung-Yi Guo,, Jeng-Hwa Liao,, Yu-Min Lin,, Chun-Min Cheng,, Jung-Yu Hsieh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2014

Мова:

english

Файл:

PDF, 393 KB

english, 2014

31

Estimation of respiratory heat flows in prediction of heat strain among Taiwanese steel workers

Chen, Wang-Yi, Juang, Yow-Jer, Hsieh, Jung-Yu, Tsai, Perng-Jy, Chen, Chen-Peng

Журнал:

International Journal of Biometeorology

Рік:

2017

Мова:

english

Файл:

PDF, 764 KB

english, 2017

32

[IEEE 2016 21st International Conference on Ion Implantation Technology (IIT) - Tainan, Taiwan (2016.9.26-2016.9.30)] 2016 21st International Conference on Ion Implantation Technology (IIT) - Investigation of Floating Gate Implantation Effect on 1Xnm NAND FLASH

Liao, Jeng-Hwa, Ko, Zong-Jie, Lin, Hsing-Ju, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2016

Мова:

english

Файл:

PDF, 1.09 MB

english, 2016

33

[IEEE 2016 21st International Conference on Ion Implantation Technology (IIT) - Tainan, Taiwan (2016.9.26-2016.9.30)] 2016 21st International Conference on Ion Implantation Technology (IIT) - Thermal Stability of Cobalt Silicide on Polysilicon Implanted with Germanium

Ko, Zong-Jie, Liao, Jeng-Hwa, Lin, Hsin-Ju, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2016

Мова:

english

Файл:

PDF, 280 KB

english, 2016

34

Secondary electron emission characteristics of oxide electrodes in flat electron emission lamp

Chiang, Chang-Lin, Zeng, Hui-Kai, Li, Chia-Hung, Li, Jung-Yu, Chen, Shih-Pu, Lin, Yi-Ping, Hsieh, Tai-Chiung, Juang, Jenh-Yih

Журнал:

Рік:

2016

Мова:

english

Файл:

PDF, 2.03 MB

english, 2016

35

Association of long-chain acyl-coenzyme A synthetaseï¿½5 expression in human breast cancer by estrogen receptor status and its clinical significance

Yen, Meng-Chi, Kan, Jung-Yu, Hsieh, Chia-Jung, Kuo, Po-Lin, Hou, Ming-Feng, Hsu, Ya-Ling

Журнал:

Oncology Reports

Рік:

2017

Мова:

english

Файл:

PDF, 749 KB

english, 2017